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[US]결함 분석 장치 및 이를 이용한 결함 분석 방법
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 정권범 | - |
| dc.contributor.author | 문연건 | - |
| dc.contributor.author | 임준형 | - |
| dc.contributor.author | 정광식 | - |
| dc.contributor.author | 홍현민 | - |
| dc.date.accessioned | 2025-10-25T04:30:17Z | - |
| dc.date.available | 2025-10-25T04:30:17Z | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/61875 | - |
| dc.title | [US]결함 분석 장치 및 이를 이용한 결함 분석 방법 | - |
| dc.title.alternative | DEFECT ANALYSIS DEVICE AND DEFECT ANALYSIS METHOD USING THE SAME | - |
| dc.type | Patent | - |
| dc.publisher.location | 미국 | - |
| dc.contributor.assignee | 동국대학교산학협력단;삼성디스플레이(주) | - |
| dc.date.application | 2023-07-31 | - |
| dc.date.registration | 2025-10-21 | - |
| dc.type.iprs | 특허 | - |
| dc.identifier.patentRegistrationNumber | US12,449,380 | - |
| dc.identifier.patentApplicationNumber | 18/227,976 | - |
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Related Researcher
- Chung, Kwun Bum
- College of Natural Science (Department of Physics)