Dynamic Pseudo Labeling via Gradient Cutting for High-Low Entropy Explorationopen access
- Authors
- Park, Jae Hyeon; Jeon, Joo Hyeon; Lee, Jae Yun; Ahn, Sangyeon; Cha, Min Hee; Kim, Min Geol; Nam, Hyeok; Cho, Sung In
- Issue Date
- 2025
- Publisher
- IEEE
- Keywords
- Dynamic Pseudo Labeling; Image Classification; Self-training; Semi-supervised Learning
- Citation
- 2025 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), pp 20602 - 20611
- Pages
- 10
- Indexed
- SCOPUS
- Journal Title
- 2025 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)
- Start Page
- 20602
- End Page
- 20611
- URI
- https://scholarworks.dongguk.edu/handle/sw.dongguk/61759
- DOI
- 10.1109/CVPR52734.2025.01918
- ISSN
- 1063-6919
2575-7075
- Abstract
- This study addresses the limitations of existing dynamic pseudo-labeling (DPL) techniques, which often utilize static or dynamic thresholds for confident sample selection. The existing methods fail to capture the non-linear relationship between task accuracy and model confidence, particularly in the context of overconfidence. This can limit the model's learning opportunities for high entropy samples that significantly influence a model's generalization ability. To solve this, we propose a novel gradient pass-based DPL technique that incorporates the high-entropy samples, which are typically overlooked. Our approach introduces two classifiers-low gradient pass (LGP) and high gradient pass (HGP)-to derive over- and under-confident dynamic thresholds that indicate the class-wise overconfidence acceleration, respectively. By combining the under- and overconfident states from the GP classifiers, we create a more adaptive and accurate PL method. Our main contributions highlight the importance of considering both low and high-confidence samples in enhancing the model's robustness and generalization for improved PL performance. © 2025 Elsevier B.V., All rights reserved.
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - ETC > 1. Journal Articles

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.