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Dynamic Pseudo Labeling via Gradient Cutting for High-Low Entropy Exploration

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dc.contributor.authorPark, Jae Hyeon-
dc.contributor.authorJeon, Joo Hyeon-
dc.contributor.authorLee, Jae Yun-
dc.contributor.authorAhn, Sangyeon-
dc.contributor.authorCha, Min Hee-
dc.contributor.authorKim, Min Geol-
dc.contributor.authorNam, Hyeok-
dc.contributor.authorCho, Sung In-
dc.date.accessioned2025-10-15T05:30:11Z-
dc.date.available2025-10-15T05:30:11Z-
dc.date.issued2025-
dc.identifier.issn1063-6919-
dc.identifier.issn2575-7075-
dc.identifier.urihttps://scholarworks.dongguk.edu/handle/sw.dongguk/61759-
dc.description.abstractThis study addresses the limitations of existing dynamic pseudo-labeling (DPL) techniques, which often utilize static or dynamic thresholds for confident sample selection. The existing methods fail to capture the non-linear relationship between task accuracy and model confidence, particularly in the context of overconfidence. This can limit the model's learning opportunities for high entropy samples that significantly influence a model's generalization ability. To solve this, we propose a novel gradient pass-based DPL technique that incorporates the high-entropy samples, which are typically overlooked. Our approach introduces two classifiers-low gradient pass (LGP) and high gradient pass (HGP)-to derive over- and under-confident dynamic thresholds that indicate the class-wise overconfidence acceleration, respectively. By combining the under- and overconfident states from the GP classifiers, we create a more adaptive and accurate PL method. Our main contributions highlight the importance of considering both low and high-confidence samples in enhancing the model's robustness and generalization for improved PL performance. © 2025 Elsevier B.V., All rights reserved.-
dc.format.extent10-
dc.language영어-
dc.language.isoENG-
dc.publisherIEEE-
dc.titleDynamic Pseudo Labeling via Gradient Cutting for High-Low Entropy Exploration-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1109/CVPR52734.2025.01918-
dc.identifier.scopusid2-s2.0-105017069193-
dc.identifier.wosid001601158200240-
dc.identifier.bibliographicCitation2025 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), pp 20602 - 20611-
dc.citation.title2025 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)-
dc.citation.startPage20602-
dc.citation.endPage20611-
dc.type.docTypeProceedings Paper-
dc.description.isOpenAccessY-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaComputer Science-
dc.relation.journalWebOfScienceCategoryComputer Science, Artificial Intelligence-
dc.relation.journalWebOfScienceCategoryComputer Science, Interdisciplinary Applications-
dc.relation.journalWebOfScienceCategoryComputer Science, Theory & Methods-
dc.subject.keywordAuthorDynamic Pseudo Labeling-
dc.subject.keywordAuthorImage Classification-
dc.subject.keywordAuthorSelf-training-
dc.subject.keywordAuthorSemi-supervised Learning-
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