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반도체 소자의 분석 방법 및 이를 위한 분석 장치

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dc.contributor.author정광식-
dc.contributor.author정권범-
dc.contributor.author홍현민-
dc.date.accessioned2025-09-09T09:35:40Z-
dc.date.available2025-09-09T09:35:40Z-
dc.identifier.urihttps://scholarworks.dongguk.edu/handle/sw.dongguk/61260-
dc.title반도체 소자의 분석 방법 및 이를 위한 분석 장치-
dc.title.alternativeANALYSIS METHOD OF SEMICONDUCTOR DEVICE AND ANALYSIS APPARATUS FOR THE METHOD-
dc.typePatent-
dc.publisher.location대한민국-
dc.contributor.assignee동국대학교산학협력단-
dc.date.application2022-04-06-
dc.date.registration2024-09-12-
dc.type.iprs특허-
dc.identifier.patentRegistrationNumber10-2708172-
dc.identifier.patentApplicationNumber10-2022-0043071-
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College of Natural Science > Division of Physics & Semiconductor Science > 4. Patents
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