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Double Sampling 기법을 이용한 전류 비교기
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 송민규 | - |
| dc.contributor.author | 김범식 | - |
| dc.contributor.author | 김승태 | - |
| dc.contributor.author | 김혁준 | - |
| dc.contributor.author | 우경돈 | - |
| dc.contributor.author | 이병재 | - |
| dc.contributor.author | 임명기 | - |
| dc.date.accessioned | 2025-09-09T09:34:15Z | - |
| dc.date.available | 2025-09-09T09:34:15Z | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/61163 | - |
| dc.title | Double Sampling 기법을 이용한 전류 비교기 | - |
| dc.title.alternative | Current Comparator with a Double Sampling | - |
| dc.type | Patent | - |
| dc.publisher.location | 대한민국 | - |
| dc.contributor.assignee | 엘지디스플레이 주식회사;동국대학교산학협력단 | - |
| dc.date.application | 2018-09-27 | - |
| dc.date.registration | 2023-06-16 | - |
| dc.type.iprs | 특허 | - |
| dc.identifier.patentRegistrationNumber | 10-2546311 | - |
| dc.identifier.patentApplicationNumber | 10-2018-0115170 | - |
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Related Researcher
- Song, Min Kyu
- College of Advanced Convergence Engineering (Division of System Semiconductor)