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Quantitative interfacial defect analysis in high mobility InSnZnO thin film transistor by the measurement of ac transconductance
- Authors
- 정권범
- Issue Date
- 28-May-2024
- Place
- 프랑스
- Conference Name
- European Materials Research Society (EMRS)
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Collections - College of Natural Science > Department of Physics > 2. Conference Papers
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Related Researcher
- Chung, Kwun Bum
- College of Natural Science (Department of Physics)