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Analysis of defect states in InSnZnO transparent thin film transistors as a function of post annealing
- Authors
- 정권범
- Issue Date
- 10-Jul-2024
- Place
- 스페인
- Conference Name
- NANOSMAT
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Collections - College of Natural Science > Department of Physics > 2. Conference Papers
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Related Researcher
- Chung, Kwun Bum
- College of Natural Science (Department of Physics)