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Analysis of defect in indium gallium zinc oxide thin film transistor as a function of ALD indium deposition cycle
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 정권범 | - |
| dc.date.accessioned | 2025-01-18T00:31:38Z | - |
| dc.date.available | 2025-01-18T00:31:38Z | - |
| dc.date.issued | 2024-06-04 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/57435 | - |
| dc.title | Analysis of defect in indium gallium zinc oxide thin film transistor as a function of ALD indium deposition cycle | - |
| dc.type | Conference | - |
| dc.citation.startPage | 96 | - |
| dc.citation.endPage | 96 | - |
| dc.citation.conferenceName | ISPSA 2024 | - |
| dc.citation.conferencePlace | 대한민국 | - |
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Collections - College of Natural Science > Department of Physics > 2. Conference Papers
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Related Researcher
- Chung, Kwun Bum
- College of Natural Science (Department of Physics)