Enhanced Catalytic Activity of CuO@CuS Core-Shell Structure for Highly Efficient HER Applicationopen access
- Authors
- Ahmed, Abu Talha Aqueel; Cho, Sangeun; Im, Hyunsik; Jana, Atanu
- Issue Date
- Dec-2024
- Publisher
- MDPI
- Keywords
- hydrothermal growth; CuS; core-shell; HER; nitrogen doping; <italic>TOF</italic>; electrocatalyst
- Citation
- Nanomaterials, v.14, no.23, pp 1 - 13
- Pages
- 13
- Indexed
- SCIE
SCOPUS
- Journal Title
- Nanomaterials
- Volume
- 14
- Number
- 23
- Start Page
- 1
- End Page
- 13
- URI
- https://scholarworks.dongguk.edu/handle/sw.dongguk/56451
- DOI
- 10.3390/nano14231941
- ISSN
- 2079-4991
2079-4991
- Abstract
- Using electrocatalytic water reduction to produce hydrogen fuel offers significant potential for clean energy, yet its large-scale adoption depends on developing cost-effective, non-precious, and efficient catalysts to replace expensive Pt-based state-of-the-art HER catalysts. The catalytic HER performance of an active catalyst largely depends on the available catalytic active sites, conductivity, and intrinsic electrochemical kinetics, all of which can be altered by incorporating a heteroatom into the active catalyst structure. Herein, we synthesized a unique nitrogen-doped CuO@CuS (NCOS) core-shell-structured catalyst through a facile hydrothermal process followed by an efficacious nitrogenation process, and its electrochemical performance for the HER was systematically analyzed. The NCOS core-shell-structured catalyst exhibits a reduced overpotential (55 mV) and Tafel slope (107 mV dec-1) compared to the pure CuS (CS; 179 mV and 201 mV dec-1) catalyst at a current density of 10 mA cm-2. Moreover, the NCOS core-shell-structured catalyst demonstrates excellent endurance for up to 50 h of chronopotentiometric testing at a driving current density rate of 10 and 100 mA cm-2. This excellent catalytic HER activity is a result of an increased electron transfer rate and a greater number of accessible active sites, attributed to a change in structural properties and the high electronic conductivity aroused from nitrogen incorporation, as evidenced from the TOF and EIS curve analyses.
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Collections - College of Advanced Convergence Engineering > Division of System Semiconductor > 1. Journal Articles

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