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Analysis of interfacial defects in oxide films and electronic devices using nonlinear optics
- Authors
- 정권범
- Issue Date
- 13-Apr-2023
- Place
- 미국
- Conference Name
- Materials Research Society (MRS) spring
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Collections - College of Natural Science > Department of Physics > 2. Conference Papers
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Related Researcher
- Chung, Kwun Bum
- College of Natural Science (Department of Physics)