Mass Fabrication of 3D Silicon Nano-/Microstructures by Fab-Free Process Using Tip-Based Lithography
- Authors
- Jo, Jeong-Sik; Choi, Jihoon; Lee, Seung-Hoon; Song, Changhoon; Noh, Heeso; Jang, Jae-Won
- Issue Date
- Jan-2021
- Publisher
- WILEY-V C H VERLAG GMBH
- Keywords
- metal-assisted chemical etching; scanning probe lithography; silicon nano-microfabrication
- Citation
- SMALL, v.17, no.4
- Indexed
- SCIE
SCOPUS
- Journal Title
- SMALL
- Volume
- 17
- Number
- 4
- URI
- https://scholarworks.dongguk.edu/handle/sw.dongguk/5500
- DOI
- 10.1002/smll.202005036
- ISSN
- 1613-6810
1613-6829
- Abstract
- Methods for the mass fabrication of 3D silicon (Si) microstructures with a 100 nm resolution are developed using scanning probe lithography (SPL) combined with metal-assisted chemical etching (MACE). Protruding Si structures, including Si nanowires of over 10 mu m in length and atypical shaped Si nano- and micropillars, are obtained via the MACE of a patterned gold film (negative tone) on Si substrates by dip-pen nanolithography (DPN) with polymer or by nanoshaving alkanethiol self-assembled monolayers (SAMs). Furthermore, recessed Si structures with arbitrary patterning and channels less than 160 nm wide and hundreds of nanometers in depth are obtained via the MACE of a patterned gold film (positive tone) on Si substrates by alkanethiol DPN. As an example of applications using protruded Si structures, nanoimprinting in an area of up to a centimeter is demonstrated through 1D and 2D SPL combined with MACE. Similarly, submicrometer polydimethylsiloxane (PDMS) stamps are employed over millimeter-scale areas for applications using recessed Si structures. In particular, the mass production of arbitrarily shaped Si microparticles at submicrometer resolution is developed using silicon-on-insulator substrates, as demonstrated using optical microresonators, surface-enhanced Raman scattering templates, and smart microparticles for fluorescence signal coding.
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Collections - College of Advanced Convergence Engineering > Division of System Semiconductor > 1. Journal Articles

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