Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Sequential annealing effects of HfSiON gate dielectric films on n-type Ge substrate
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 정권범 | - |
| dc.date.accessioned | 2024-10-30T18:43:36Z | - |
| dc.date.available | 2024-10-30T18:43:36Z | - |
| dc.date.issued | 2016-10-19 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/53098 | - |
| dc.title | Sequential annealing effects of HfSiON gate dielectric films on n-type Ge substrate | - |
| dc.type | Conference | - |
| dc.citation.startPage | 211 | - |
| dc.citation.endPage | 211 | - |
| dc.citation.conferenceName | 한국물리학회 | - |
| dc.citation.conferencePlace | 대한민국 | - |
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - College of Natural Science > Department of Physics > 2. Conference Papers
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
Related Researcher
- Chung, Kwun Bum
- College of Natural Science (Department of Physics)