Cited 5 time in
Synaptic Device With High Rectification Ratio Resistive Switching and Its Impact on Spiking Neural Network
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Chae Soo | - |
| dc.contributor.author | Kim, Taehyung | - |
| dc.contributor.author | Min, Kyung Kyu | - |
| dc.contributor.author | Kim, Yeonwoo | - |
| dc.contributor.author | Kim, Sungjun | - |
| dc.contributor.author | Park, Byung-Gook | - |
| dc.date.accessioned | 2023-04-27T18:40:25Z | - |
| dc.date.available | 2023-04-27T18:40:25Z | - |
| dc.date.issued | 2021-04 | - |
| dc.identifier.issn | 0018-9383 | - |
| dc.identifier.issn | 1557-9646 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/5147 | - |
| dc.description.abstract | We propose self-rectifying resistive random access memory (RRAM) synapse to prevent reverse leakage current problem which occurs when RRAM is integrated with integrate and fire (IF) circuit in spiking neural network (SNN). Ni/W/SiNx/n-Si RRAM was fabricated by varying the bottom electrode (BE) doping concentration and their rectifying characteristics were analyzed. Low BE doping concentration device showed self-rectifying characteristics without any additional selector or diode device. Furthermore, hardware-based system-level simulation was conducted to evaluate the effect of self-rectifying RRAM synapse on MNIST classification accuracy. About 93.34% accuracy was obtained using the proposed RRAM. | - |
| dc.format.extent | 6 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
| dc.title | Synaptic Device With High Rectification Ratio Resistive Switching and Its Impact on Spiking Neural Network | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1109/TED.2021.3059182 | - |
| dc.identifier.scopusid | 2-s2.0-85102311968 | - |
| dc.identifier.wosid | 000633331000032 | - |
| dc.identifier.bibliographicCitation | IEEE TRANSACTIONS ON ELECTRON DEVICES, v.68, no.4, pp 1610 - 1615 | - |
| dc.citation.title | IEEE TRANSACTIONS ON ELECTRON DEVICES | - |
| dc.citation.volume | 68 | - |
| dc.citation.number | 4 | - |
| dc.citation.startPage | 1610 | - |
| dc.citation.endPage | 1615 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Engineering | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.subject.keywordAuthor | Synapses | - |
| dc.subject.keywordAuthor | Neurons | - |
| dc.subject.keywordAuthor | Doping | - |
| dc.subject.keywordAuthor | Switches | - |
| dc.subject.keywordAuthor | Micromechanical devices | - |
| dc.subject.keywordAuthor | Silicon | - |
| dc.subject.keywordAuthor | Schottky diodes | - |
| dc.subject.keywordAuthor | Neuromorphic | - |
| dc.subject.keywordAuthor | resistive random access memory (RRAM) | - |
| dc.subject.keywordAuthor | self-rectifying | - |
| dc.subject.keywordAuthor | synaptic device | - |
| dc.subject.keywordAuthor | system-level simulation | - |
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