Applications  of Examiner Patent Citations in Analyzing the Value of Technology

윤병운

Detailed Information

Cited 0 time in webofscience

Cited 0 time in scopus

Metadata Downloads

Applications of Examiner Patent Citations in Analyzing the Value of Technology

Authors: 윤병운

Issue Date: 22-May-2014

URI: https://scholarworks.dongguk.edu/handle/sw.dongguk/49953

Place: 대한민국

Conference Name: IAMOT

Files in This Item: There are no files associated with this item.

Appears in Collections: College of Engineering > Department of Industrial and Systems Engineering > 2. Conference Papers

Show full item record

qrcode

Related Researcher

Researcher Yoon, Byung Un photo

Yoon, Byung Un: College of Engineering (Department of Industrial and Systems Engineering)

Read more

Altmetrics

Total Views & Downloads

RSS_1.0 RSS_2.0 ATOM_1.0

30, Pildong-ro 1-gil, Jung-gu, Seoul, 04620, Republic of Korea+82-2-2260-3114

Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.

Detailed Information

Related Researcher

Altmetrics

Total Views & Downloads

BROWSE