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Applications of Examiner Patent Citations in Analyzing the Value of Technology
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 윤병운 | - |
| dc.date.accessioned | 2024-10-30T15:04:03Z | - |
| dc.date.available | 2024-10-30T15:04:03Z | - |
| dc.date.issued | 2014-05-22 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/49953 | - |
| dc.title | Applications of Examiner Patent Citations in Analyzing the Value of Technology | - |
| dc.type | Conference | - |
| dc.citation.startPage | 1 | - |
| dc.citation.endPage | 10 | - |
| dc.citation.conferenceName | IAMOT | - |
| dc.citation.conferencePlace | 대한민국 | - |
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Related Researcher
- Yoon, Byung Un
- College of Engineering (Department of Industrial and Systems Engineering)