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Deep-Level Defects on Nitrogen-doped ZnO thin films by Photocurrent Transient Spectroscopy
- Authors
- 조훈영
- Issue Date
- 25-Jul-2013
- Place
- 이탈리아
볼로냐
- Conference Date
- 2013-07-21 ~ 2013-07-26
- Conference Name
- International Conference on Defects in Semiconductors
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Collections - College of Natural Science > Department of Physics > 2. Conference Papers
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