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Deep-Level Defects on Nitrogen-doped ZnO thin films by Photocurrent Transient Spectroscopy
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 조훈영 | - |
| dc.date.accessioned | 2024-10-30T13:43:35Z | - |
| dc.date.available | 2024-10-30T13:43:35Z | - |
| dc.date.issued | 2013-07-25 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/48830 | - |
| dc.title | Deep-Level Defects on Nitrogen-doped ZnO thin films by Photocurrent Transient Spectroscopy | - |
| dc.type | Conference | - |
| dc.citation.startPage | 25 | - |
| dc.citation.endPage | 26 | - |
| dc.citation.conferenceName | International Conference on Defects in Semiconductors | - |
| dc.citation.conferencePlace | 이탈리아 | - |
| dc.citation.conferencePlace | 볼로냐 | - |
| dc.citation.conferenceDate | 2013-07-21 ~ 2013-07-26 | - |
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