A numerical method for spatially-distributed transient simulation to replicate nonlinear 'defect-irrelevant' behaviors of no-insulation HTS coil
- Authors
- Kim, Geonyoung; Musso, Andrea; Bang, Jeseok; Lee, Jung Tae; Im, Chaemin; Choi, Kibum; Kim, Jaemin; Breschi, Marco; Han, Ki Jin; Hahn, Seungyong
- Issue Date
- Nov-2021
- Publisher
- IOP PUBLISHING LTD
- Keywords
- defect-irrelevant-winding; no-insulation winding; partial element equivalent circuit; resistivity parameterization
- Citation
- SUPERCONDUCTOR SCIENCE & TECHNOLOGY, v.34, no.11
- Indexed
- SCIE
SCOPUS
- Journal Title
- SUPERCONDUCTOR SCIENCE & TECHNOLOGY
- Volume
- 34
- Number
- 11
- URI
- https://scholarworks.dongguk.edu/handle/sw.dongguk/4230
- DOI
- 10.1088/1361-6668/ac211f
- ISSN
- 0953-2048
1361-6668
- Abstract
- This paper presents a numerical method, based on the partial element equivalent circuit (PEEC) technique, for spatially-distributed and time-varying simulation to analyze nonlinear 'defect-irrelevant' behaviors of a no-insulation (NI) high temperature superconductor (HTS) coil. We suggest a resistivity parameterization approach in combination of the PEEC method to replicate electromagnetic dynamics of an NI HTS coil containing multiple 'defects.' The proposed method is adopted to investigate 'defect-irrelevant' behaviors of an NI single pancake coil having lap joints as a form of artificial defects. To validate our approach, electromagnetic characteristics of the NI test coil are measured in a bath of liquid nitrogen at 77 K and compared with four key simulation results: (a) local voltages; (b) current distribution; (c) magnetic field; and (d) Joule heating distribution. Experimental measurements of local voltages and the magnetic field are compared to the simulation results to validate our numerical method.
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - College of Engineering > Department of Electronics and Electrical Engineering > 1. Journal Articles

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.