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A numerical method for spatially-distributed transient simulation to replicate nonlinear 'defect-irrelevant' behaviors of no-insulation HTS coil

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dc.contributor.authorKim, Geonyoung-
dc.contributor.authorMusso, Andrea-
dc.contributor.authorBang, Jeseok-
dc.contributor.authorLee, Jung Tae-
dc.contributor.authorIm, Chaemin-
dc.contributor.authorChoi, Kibum-
dc.contributor.authorKim, Jaemin-
dc.contributor.authorBreschi, Marco-
dc.contributor.authorHan, Ki Jin-
dc.contributor.authorHahn, Seungyong-
dc.date.accessioned2023-04-27T15:40:27Z-
dc.date.available2023-04-27T15:40:27Z-
dc.date.issued2021-11-
dc.identifier.issn0953-2048-
dc.identifier.issn1361-6668-
dc.identifier.urihttps://scholarworks.dongguk.edu/handle/sw.dongguk/4230-
dc.description.abstractThis paper presents a numerical method, based on the partial element equivalent circuit (PEEC) technique, for spatially-distributed and time-varying simulation to analyze nonlinear 'defect-irrelevant' behaviors of a no-insulation (NI) high temperature superconductor (HTS) coil. We suggest a resistivity parameterization approach in combination of the PEEC method to replicate electromagnetic dynamics of an NI HTS coil containing multiple 'defects.' The proposed method is adopted to investigate 'defect-irrelevant' behaviors of an NI single pancake coil having lap joints as a form of artificial defects. To validate our approach, electromagnetic characteristics of the NI test coil are measured in a bath of liquid nitrogen at 77 K and compared with four key simulation results: (a) local voltages; (b) current distribution; (c) magnetic field; and (d) Joule heating distribution. Experimental measurements of local voltages and the magnetic field are compared to the simulation results to validate our numerical method.-
dc.language영어-
dc.language.isoENG-
dc.publisherIOP PUBLISHING LTD-
dc.titleA numerical method for spatially-distributed transient simulation to replicate nonlinear 'defect-irrelevant' behaviors of no-insulation HTS coil-
dc.typeArticle-
dc.publisher.location영국-
dc.identifier.doi10.1088/1361-6668/ac211f-
dc.identifier.scopusid2-s2.0-85117170443-
dc.identifier.wosid000700758500001-
dc.identifier.bibliographicCitationSUPERCONDUCTOR SCIENCE & TECHNOLOGY, v.34, no.11-
dc.citation.titleSUPERCONDUCTOR SCIENCE & TECHNOLOGY-
dc.citation.volume34-
dc.citation.number11-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.subject.keywordPlusINDUCTANCE-
dc.subject.keywordAuthordefect-irrelevant-winding-
dc.subject.keywordAuthorno-insulation winding-
dc.subject.keywordAuthorpartial element equivalent circuit-
dc.subject.keywordAuthorresistivity parameterization-
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