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Interface Defects at the Si(100)/HfO2 Interface using DLTS Measurement
- Authors
- 조훈영
- Issue Date
- 7-Oct-2009
- Place
- 오스트리아
오스트리아
- Conference Date
- 2009-10-04 ~ 2009-10-09
- Conference Name
- 216th Elecrochemical Society meeting
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Collections - College of Natural Science > Department of Physics > 2. Conference Papers
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