Charge capture kinetics of extended detect in Ge-condensed SGOI sturucture

조훈영

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Charge capture kinetics of extended detect in Ge-condensed SGOI sturucture

Authors: 조훈영

Issue Date: 16-Sep-2008

URI: https://scholarworks.dongguk.edu/handle/sw.dongguk/41951

Place: 프랑스
Pointiers

Conference Date: 2008-09-14 ~ 2008-09-19

Conference Name: Extended Defects in Semiconductors 2008

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Appears in Collections: College of Natural Science > Department of Physics > 2. Conference Papers

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