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Charge capture kinetics of extended detect in Ge-condensed SGOI sturucture
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 조훈영 | - |
| dc.date.accessioned | 2024-10-30T06:02:46Z | - |
| dc.date.available | 2024-10-30T06:02:46Z | - |
| dc.date.issued | 2008-09-16 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/41951 | - |
| dc.title | Charge capture kinetics of extended detect in Ge-condensed SGOI sturucture | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | Extended Defects in Semiconductors 2008 | - |
| dc.citation.conferencePlace | 프랑스 | - |
| dc.citation.conferencePlace | Pointiers | - |
| dc.citation.conferenceDate | 2008-09-14 ~ 2008-09-19 | - |
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Collections - College of Natural Science > Department of Physics > 2. Conference Papers
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