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Fabrication and Characterization of High Breakdown Voltage Ni/4H-SiC and Ni-/6H-SiC Schottky Diodes
- Authors
- 박현창
- Issue Date
- 6-Nov-1998
- Place
- 대한민국
서울
- Conference Date
- 1998-11-06 ~ 1998-11-07
- Conference Name
- ISPSA-98
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Related Researcher
- Park, Hyun Chang
- College of Engineering (Department of Electronics and Electrical Engineering)