Investigation of Te/Si(001) interface grown by MBE

김현정

Detailed Information

Cited 0 time in webofscience

Cited 0 time in scopus

Metadata Downloads

Investigation of Te/Si(001) interface grown by MBE

Authors: 김현정

Issue Date: 14-Nov-2000

URI: https://scholarworks.dongguk.edu/handle/sw.dongguk/36613

Place: 중국
Xian

Conference Date: 2000-11-14 ~ 2000-11-16

Conference Name: 2000 China-Korea Joint Symposium Semiconductor Physics and Device Application

Files in This Item: There are no files associated with this item.

Appears in Collections: ETC > 2. Conference Papers

Show full item record

qrcode

Altmetrics

Total Views & Downloads

RSS_1.0 RSS_2.0 ATOM_1.0

30, Pildong-ro 1-gil, Jung-gu, Seoul, 04620, Republic of Korea+82-2-2260-3114

Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.

Detailed Information

Altmetrics

Total Views & Downloads

BROWSE