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Investigation of Te/Si(001) interface grown by MBE
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김현정 | - |
| dc.date.accessioned | 2024-10-30T02:21:00Z | - |
| dc.date.available | 2024-10-30T02:21:00Z | - |
| dc.date.issued | 2000-11-14 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/36613 | - |
| dc.title | Investigation of Te/Si(001) interface grown by MBE | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 2000 China-Korea Joint Symposium Semiconductor Physics and Device Application | - |
| dc.citation.conferencePlace | 중국 | - |
| dc.citation.conferencePlace | Xian | - |
| dc.citation.conferenceDate | 2000-11-14 ~ 2000-11-16 | - |
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