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X-ray Diffraction Analysis of the Defect Structure in AlxGa1-xN Films Grown by Metalorganic Chemical Vapor Deposition
- Authors
- 강태원
- Issue Date
- 9-Mar-2003
- Place
- 일본
AWAJI YUMEBUTAI International Conference Center
- Conference Date
- 2003-03-09 ~ 2003-03-12
- Conference Name
- First Asia-Pacific Workshop on Widegap Semiconductors
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Collections - ETC > 2. Conference Papers
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