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Cited 227 time in webofscience Cited 236 time in scopus
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Perovskite: Scintillators, direct detectors, and X-ray imagersopen access

Authors
Jana, AtanuCho, SangeunPatil, Supriya A.Meena, AbhishekJo, YongcheolSree, Vijaya GopalanPark, YoungsinKim, HyungsangIm, HyunsikTaylor, Robert A.
Issue Date
May-2022
Publisher
Elsevier BV
Keywords
Perovskite; Scintillator; Direct detector; High-energy radiation; X-ray imaging; film phototransistor (TFT) arrays; amorphous Si photodiodes
Citation
Materials Today, v.55, pp 110 - 136
Pages
27
Indexed
SCIE
SCOPUS
Journal Title
Materials Today
Volume
55
Start Page
110
End Page
136
URI
https://scholarworks.dongguk.edu/handle/sw.dongguk/3234
DOI
10.1016/j.mattod.2022.04.009
ISSN
1369-7021
1873-4103
Abstract
Halide perovskites (HPs) are used in various applications, including solar cells, light-emitting diodes, lasers, and photodetectors. These materials have recently received a great deal of attention as highenergy radiation detectors and scintillators due to their excellent light yield, mobility-lifetime product (ms), and X-ray sensitivity. In addition, due to their solution-processability and low cost, perovskite materials could be used to produce thick perovskite films across wide areas, allowing for low-dose X-ray imaging. Perovskite-based scintillators and detectors could eventually replace commercialized products like thallium-doped cesium iodide (CsI:Tl) and amorphous silicon (Si). Here, we review all of the key properties of HPs, the relevant terminology necessary for radiation detection and scintillation, the physical mechanisms underlying their operation, the fabrication process, and perovskite crystals and thin-films of varying dimensionality used for high-energy radiation detection. We also cover the critical issues and solutions that HPs as detectors, scintillators, and imagers face.
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College of Advanced Convergence Engineering > ETC > 1. Journal Articles
College of Natural Science > Department of Physics > 1. Journal Articles
College of Advanced Convergence Engineering > Division of System Semiconductor > 1. Journal Articles

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