The origin of memory traps in SONOS structure by Ge and Si implantation

조훈영

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The origin of memory traps in SONOS structure by Ge and Si implantation

Authors: 조훈영

Issue Date: 24-Oct-2004

URI: https://scholarworks.dongguk.edu/handle/sw.dongguk/32306

Place: 대한민국
경북대

Conference Date: 2004-10-24 ~ 2004-10-26

Conference Name: 한국물리학회 총회

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Appears in Collections: College of Natural Science > Department of Physics > 2. Conference Papers

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