Effects of Rapid Thermal Annealing on Native Defect-Related Emissions of ZnO thin films

김득영

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Effects of Rapid Thermal Annealing on Native Defect-Related Emissions of ZnO thin films

Authors: 김득영

Issue Date: 31-May-2005

URI: https://scholarworks.dongguk.edu/handle/sw.dongguk/29806

Place: 프랑스
Straussburg

Conference Date: 2005-05-31 ~ 2005-06-03

Conference Name: European-Materials Research Society 2005 Spring Meeting

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Appears in Collections: College of Natural Science > Division of Physics & Semiconductor Science > 2. Conference Papers

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