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Effects of Rapid Thermal Annealing on Native Defect-Related Emissions of ZnO thin films

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dc.contributor.author김득영-
dc.date.accessioned2024-10-30T01:25:59Z-
dc.date.available2024-10-30T01:25:59Z-
dc.date.issued2005-05-31-
dc.identifier.urihttps://scholarworks.dongguk.edu/handle/sw.dongguk/29806-
dc.titleEffects of Rapid Thermal Annealing on Native Defect-Related Emissions of ZnO thin films-
dc.typeConference-
dc.citation.conferenceNameEuropean-Materials Research Society 2005 Spring Meeting-
dc.citation.conferencePlace프랑스-
dc.citation.conferencePlaceStraussburg-
dc.citation.conferenceDate2005-05-31 ~ 2005-06-03-
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College of Natural Science > Division of Physics & Semiconductor Science > 2. Conference Papers

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