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Comparative studies on the conventional Metamorphic High Electron Mobility Transistor and InP-composite channel Metamorphic High Electron Mobility Transistor on the breakdown Voltage

Authors
김삼동
Issue Date
28-Jun-2005
URI
https://scholarworks.dongguk.edu/handle/sw.dongguk/29663
Place
대한민국
서울대학교
Conference Date
2005-06-28 ~ 2005-06-30
Conference Name
AWAD 2005
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College of Engineering > Department of Electronics and Electrical Engineering > 2. Conference Papers

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