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Comparative studies on the conventional Metamorphic High Electron Mobility Transistor and InP-composite channel Metamorphic High Electron Mobility Transistor on the breakdown Voltage

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dc.contributor.author김삼동-
dc.date.accessioned2024-10-30T01:25:37Z-
dc.date.available2024-10-30T01:25:37Z-
dc.date.issued2005-06-28-
dc.identifier.urihttps://scholarworks.dongguk.edu/handle/sw.dongguk/29663-
dc.titleComparative studies on the conventional Metamorphic High Electron Mobility Transistor and InP-composite channel Metamorphic High Electron Mobility Transistor on the breakdown Voltage-
dc.typeConference-
dc.citation.conferenceNameAWAD 2005-
dc.citation.conferencePlace대한민국-
dc.citation.conferencePlace서울대학교-
dc.citation.conferenceDate2005-06-28 ~ 2005-06-30-
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College of Engineering > Department of Electronics and Electrical Engineering > 2. Conference Papers

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