Charge Traps and Interface Traps in Non-volatile Memory Device with Oxide-Nitride-Oxide Structures

조훈영

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Charge Traps and Interface Traps in Non-volatile Memory Device with Oxide-Nitride-Oxide Structures

Authors: 조훈영

Issue Date: 19-May-2007

URI: https://scholarworks.dongguk.edu/handle/sw.dongguk/27813

Place: 대한민국
MERCURE MARSEILLE EURO CENTRE

Conference Date: 2007-05-19 ~ 2007-05-25

Conference Name: 5th International Conference on Silicon Epitaxy and Heterostructures

Files in This Item: There are no files associated with this item.

Appears in Collections: College of Natural Science > Department of Physics > 2. Conference Papers

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