Effective similarity measurement for key-point matching in images
- Authors
- Lee, Sungmin; Jung, Seung-Won; Won, Chee Sun
- Issue Date
- Dec-2015
- Publisher
- Springer Verlag
- Keywords
- Image retrieval; Image similarity measure; Key-point detector/descriptor; SIFT
- Citation
- Lecture Notes in Electrical Engineering, v.373, pp 223 - 228
- Pages
- 6
- Indexed
- SCOPUS
- Journal Title
- Lecture Notes in Electrical Engineering
- Volume
- 373
- Start Page
- 223
- End Page
- 228
- URI
- https://scholarworks.dongguk.edu/handle/sw.dongguk/25594
- DOI
- 10.1007/978-981-10-0281-6_32
- ISSN
- 1876-1100
1876-1119
- Abstract
- Different similarity measures between the descriptors of the key-points certainly yield different performances in image matching. In this paper we introduce an effective similarity measurement, which considers the distances of each key-point in a query image and its matched key-point with the smallest distance in the test image. Therefore, the distances of all key-points in the query image to the corresponding matched key-points in the test image contribute to the final similarity measurement. On the other hand, the previous method considers only the distances less than a threshold value of all possible key-point pairs, which may ignore a significant part of the key-points in the query image. Our experiments show that the proposed measure yields better performance for image similarity matching and retrieval. © Springer Science+Business Media Singapore 2015.
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Collections - College of Engineering > Department of Electronics and Electrical Engineering > 1. Journal Articles

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