Detailed Information

Cited 0 time in webofscience Cited 1 time in scopus
Metadata Downloads

Effective similarity measurement for key-point matching in images

Authors
Lee, SungminJung, Seung-WonWon, Chee Sun
Issue Date
Dec-2015
Publisher
Springer Verlag
Keywords
Image retrieval; Image similarity measure; Key-point detector/descriptor; SIFT
Citation
Lecture Notes in Electrical Engineering, v.373, pp 223 - 228
Pages
6
Indexed
SCOPUS
Journal Title
Lecture Notes in Electrical Engineering
Volume
373
Start Page
223
End Page
228
URI
https://scholarworks.dongguk.edu/handle/sw.dongguk/25594
DOI
10.1007/978-981-10-0281-6_32
ISSN
1876-1100
1876-1119
Abstract
Different similarity measures between the descriptors of the key-points certainly yield different performances in image matching. In this paper we introduce an effective similarity measurement, which considers the distances of each key-point in a query image and its matched key-point with the smallest distance in the test image. Therefore, the distances of all key-points in the query image to the corresponding matched key-points in the test image contribute to the final similarity measurement. On the other hand, the previous method considers only the distances less than a threshold value of all possible key-point pairs, which may ignore a significant part of the key-points in the query image. Our experiments show that the proposed measure yields better performance for image similarity matching and retrieval. © Springer Science+Business Media Singapore 2015.
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > Department of Electronics and Electrical Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Altmetrics

Total Views & Downloads

BROWSE