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Antireflective conducting nanostructures with an atomic layer deposited an AlZnO layer on a transparent substrate

Authors
Park, Hyun-WooJi, SeungmukHerdini, Diptya SuciLim, HyuneuiPark, Jin-SeongChung, Kwun-Bum
Issue Date
Dec-2015
Publisher
ELSEVIER
Keywords
Anti-reflection coating; Transparent conducting oxide; Al doped ZnO; Atomic layer deposition
Citation
APPLIED SURFACE SCIENCE, v.357, pp 2385 - 2390
Pages
6
Indexed
SCI
SCIE
SCOPUS
Journal Title
APPLIED SURFACE SCIENCE
Volume
357
Start Page
2385
End Page
2390
URI
https://scholarworks.dongguk.edu/handle/sw.dongguk/25286
DOI
10.1016/j.apsusc.2015.09.256
ISSN
0169-4332
1873-5584
Abstract
The antireflective conducting nanostructures on a transparent substrate were shown to have enhanced optical and electrical properties via colloidal lithography and atomic layer deposition. The conformal AlZnO layer on a transparent nanostructured substrate exhibited 5.52 x 10(-4) Omega cm in resistivity and 88% in average visible transmittance, both of which were superior to those of a flat transparent conducting substrate. The improvement of transparency was explained by the gradual changes of the refractive index in the film depth direction. The decrease in electrical resistivity is strongly correlated to the increased surface area with the nanostructure and the change of chemical bonding states. (C) 2015 Elsevier B.V. All rights reserved.
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