Cited 4 time in
Extremely Low-Cost, Scalable Oxide Semiconductors Employing Poly(acrylic acid)-Decorated Carbon Nanotubes for Thin-Film Transistor Applications
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Hong, Gyu Ri | - |
| dc.contributor.author | Lee, Sun Sook | - |
| dc.contributor.author | Jo, Yejin | - |
| dc.contributor.author | Choi, Min Jun | - |
| dc.contributor.author | Kang, Yun Chan | - |
| dc.contributor.author | Ryu, Beyong-Hwan | - |
| dc.contributor.author | Chung, Kwun-Bum | - |
| dc.contributor.author | Choi, Youngmin | - |
| dc.contributor.author | Jeong, Sunho | - |
| dc.date.accessioned | 2024-09-26T09:03:00Z | - |
| dc.date.available | 2024-09-26T09:03:00Z | - |
| dc.date.issued | 2016-11-09 | - |
| dc.identifier.issn | 1944-8244 | - |
| dc.identifier.issn | 1944-8252 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/23868 | - |
| dc.description.abstract | In this study, we report for the first time a simple bar-coating process of soluble metal oxide semiconductors, consuming the 0.1 g of precursor solution in 4 in. sized devices with a cost of only $0.05. To resolve the issue of critical degradation in device performance observable in slow-evaporation-based film formation processes, we incorporate the unprecedentedly developed, poly(acrylic acid)-decorated multiwalled carbon nanotubes (MWNTs) in oxide semiconductors. It is demonstrated that a field-effect mobility is improved to the value of 7.34 cm(2)/(V s) (improvement by a factor of 2) without any critical variation in threshold voltage and on/off current ratio. | - |
| dc.format.extent | 8 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | AMER CHEMICAL SOC | - |
| dc.title | Extremely Low-Cost, Scalable Oxide Semiconductors Employing Poly(acrylic acid)-Decorated Carbon Nanotubes for Thin-Film Transistor Applications | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1021/acsami.6b08950 | - |
| dc.identifier.scopusid | 2-s2.0-84994884873 | - |
| dc.identifier.wosid | 000387737200002 | - |
| dc.identifier.bibliographicCitation | ACS APPLIED MATERIALS & INTERFACES, v.8, no.44, pp 29858 - 29865 | - |
| dc.citation.title | ACS APPLIED MATERIALS & INTERFACES | - |
| dc.citation.volume | 8 | - |
| dc.citation.number | 44 | - |
| dc.citation.startPage | 29858 | - |
| dc.citation.endPage | 29865 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | sci | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
| dc.relation.journalResearchArea | Materials Science | - |
| dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
| dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
| dc.subject.keywordPlus | HIGH-PERFORMANCE | - |
| dc.subject.keywordPlus | ZINC-OXIDE | - |
| dc.subject.keywordPlus | LOW-TEMPERATURE | - |
| dc.subject.keywordPlus | SOL-GEL | - |
| dc.subject.keywordPlus | O SEMICONDUCTORS | - |
| dc.subject.keywordPlus | TRANSPARENT | - |
| dc.subject.keywordPlus | ACTIVATION | - |
| dc.subject.keywordPlus | FORMAMIDE | - |
| dc.subject.keywordPlus | BUFFER | - |
| dc.subject.keywordPlus | ANODE | - |
| dc.subject.keywordAuthor | low cost | - |
| dc.subject.keywordAuthor | scalable | - |
| dc.subject.keywordAuthor | oxide semiconductor | - |
| dc.subject.keywordAuthor | carbon nanotube | - |
| dc.subject.keywordAuthor | thin-film transistor | - |
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