Detailed Information

Cited 43 time in webofscience Cited 48 time in scopus
Metadata Downloads

Studies on copper oxide thin films prepared by simple nebulizer spray technique

Full metadata record
DC Field Value Language
dc.contributor.authorPrabu, R. David-
dc.contributor.authorValanarasu, S.-
dc.contributor.authorKulandaisamy, I.-
dc.contributor.authorGanesh, V.-
dc.contributor.authorShkir, Mohd-
dc.contributor.authorKathalingam, A.-
dc.date.accessioned2024-09-26T09:02:44Z-
dc.date.available2024-09-26T09:02:44Z-
dc.date.issued2017-05-
dc.identifier.issn0957-4522-
dc.identifier.issn1573-482X-
dc.identifier.urihttps://scholarworks.dongguk.edu/handle/sw.dongguk/23775-
dc.description.abstractCopper oxide films were deposited by simple nebulizer spray pyrolysis technique using aqueous solution of Copper(II) acetate monohydrate, high pure glucose and 20 vol% of 2-propanol. Structural, morphological, optical and electrical properties of the deposited films were characterized by XRD, Laser Raman, AFM, UV-Vis and Hall Effect measurements. The XRD study confirmed that the copper oxide films are in polycrystalline form of cuprous oxide (Cu2O) phase with cubic crystal structure for the films deposited using precursor volumes of 3 and 4 ml, whereas the films deposited using 5 ml precursor solution are in cupric oxide (CuO) phase with monoclinic crystal structure. The higher concentration films shows higher thickness (similar to 600 nm for 5 ml) and that change the phase/composition of the films. The prepared CuO films with 5 ml precursor solution are expected to show better properties. AFM studies revealed that the surfaces of the films are very smooth with uniformly distributed grains. The surface roughness of the film was increased with volume of the solution and the grain islands were coalesced with each other. UV visible spectrophotometer measurements showed that the band gap value of the prepared copper oxide thin films is varied between 1.63 and 1.23 eV due to change of volume of the solution. Hall Effect measurement showed that the prepared films are in p-type conductivity with 8.21 x10(2) Omega-cm resistivity (rho) and 12.56 x10(15) cm(-3) carrier concentration (n) for the films prepared at 5 ml solution. All the studied properties of CuO for 5 ml precursor solution are remarkably changed.-
dc.format.extent9-
dc.language영어-
dc.language.isoENG-
dc.publisherSPRINGER-
dc.titleStudies on copper oxide thin films prepared by simple nebulizer spray technique-
dc.typeArticle-
dc.publisher.location네델란드-
dc.identifier.doi10.1007/s10854-017-6371-2-
dc.identifier.scopusid2-s2.0-85010950593-
dc.identifier.wosid000399709300050-
dc.identifier.bibliographicCitationJOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, v.28, no.9, pp 6754 - 6762-
dc.citation.titleJOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS-
dc.citation.volume28-
dc.citation.number9-
dc.citation.startPage6754-
dc.citation.endPage6762-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClasssci-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.subject.keywordPlusRESONANCE RAMAN-SCATTERING-
dc.subject.keywordPlusYELLOW EXCITON-
dc.subject.keywordPlusCU2O-
dc.subject.keywordPlusDEPOSITION-
dc.subject.keywordPlusPYROLYSIS-
dc.subject.keywordPlusOXYGEN-
dc.subject.keywordPlusPOWER-
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > ETC > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Kathalingam, Adaikalam photo

Kathalingam, Adaikalam
College of Engineering
Read more

Altmetrics

Total Views & Downloads

BROWSE