Effects of Y contents on surface, structural, optical, and electrical properties for Y-doped ZnO thin films
- Authors
- Heo, Sungeun; Sharma, Sanjeev K.; Lee, Sejoon; Lee, Youngmin; Kim, Changmin; Lee, Byungho; Lee, Hwangho; Kim, Deuk Young
- Issue Date
- 2-May-2014
- Publisher
- ELSEVIER SCIENCE SA
- Keywords
- Yttrium-doped zinc oxide; Thin films; Sol-gel deposition; Structural properties; Electrical properties; Photoluminescence
- Citation
- THIN SOLID FILMS, v.558, pp 27 - 30
- Pages
- 4
- Indexed
- SCI
SCIE
SCOPUS
- Journal Title
- THIN SOLID FILMS
- Volume
- 558
- Start Page
- 27
- End Page
- 30
- URI
- https://scholarworks.dongguk.edu/handle/sw.dongguk/23517
- DOI
- 10.1016/j.tsf.2014.02.025
- ISSN
- 0040-6090
- Abstract
- For the sol-gel synthesis of Y-doped ZnO (YZO) thin films, the mole concentration of Y significantly affects the physical properties of YZO. Namely, the incorporation of Y dopants into ZnO helps improve the surface, structural, optical, and electrical properties of YZO. When the appropriate concentration of Y is doped in YZO (i.e., Y similar to 2 at.%), the densities of oxygen-related native point defects are minimized, and the crystallite sizes of YZO grains are maximized. Consequently, the YZO (Y: 2 at.%) films show the improved electrical properties with the lower Hall resistivity. (C) 2014 Elsevier B.V. All rights reserved.
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Collections - College of Natural Science > Division of Physics & Semiconductor Science > 1. Journal Articles

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