A 240-FPS In-Column Binarized Neural Network Processing in CMOS Image Sensorsopen access
- Authors
- Jeong, Bohyeok; Lee, Jaehwan; Lee, Suhyeon; Lee, Soyeon; Son, Youngdoo; Kim, Soo Youn
- Issue Date
- Oct-2023
- Publisher
- IEEE
- Keywords
- always-on; binarized neural network; Charge transfer; CMOS image sensor; Convolution; edge mask; face detection; Image edge detection; Neural networks; Power demand; row buffer; Switching circuits; Voltage control
- Citation
- IEEE Transactions on Circuits and Systems II: Express Briefs, v.70, no.10, pp 3907 - 3911
- Pages
- 5
- Indexed
- SCIE
SCOPUS
- Journal Title
- IEEE Transactions on Circuits and Systems II: Express Briefs
- Volume
- 70
- Number
- 10
- Start Page
- 3907
- End Page
- 3911
- URI
- https://scholarworks.dongguk.edu/handle/sw.dongguk/22736
- DOI
- 10.1109/TCSII.2023.3295391
- ISSN
- 1549-7747
1558-3791
- Abstract
- This paper presents a CMOS image sensor (CIS) integrated with a binarized neural network (BNN) for face detection in always-on image classification applications. We propose a process variation-immune comparator-based row buffer generating edge images that are inputs of the BNN processor. To reduce the power consumption of column-parallel row buffers, we adopted comparator-based switched capacitor (CBSC) circuits. With a proposed auto-zeroed current source block circuit that operates with low supply voltages, we observed a low variation of row buffers’ outputs. The measurement results showed that the σ/μ of the row buffers’ output is decreased by 4% while reducing 28% of power consumption compared to conventional CBSC-based row buffers. The proposed CIS with an in-column BNN processor having a single channel and two hidden layers was fabricated in a 1-poly 4-metal 110nm CIS process. As a measurement result, we achieved an image classification accuracy is 97.75%. Furthermore, the image resolution is 120×120, and the total power consumption of the proposed CIS is 3.78 mW with supply voltages of 2.8 V and 1.5 V at 240 frames per second. IEEE
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- Appears in
Collections - College of Engineering > Department of Industrial and Systems Engineering > 1. Journal Articles
- College of Advanced Convergence Engineering > Division of System Semiconductor > 1. Journal Articles

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