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Cited 2 time in webofscience Cited 3 time in scopus
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A 240-FPS In-Column Binarized Neural Network Processing in CMOS Image Sensorsopen access

Authors
Jeong, BohyeokLee, JaehwanLee, SuhyeonLee, SoyeonSon, YoungdooKim, Soo Youn
Issue Date
Oct-2023
Publisher
IEEE
Keywords
always-on; binarized neural network; Charge transfer; CMOS image sensor; Convolution; edge mask; face detection; Image edge detection; Neural networks; Power demand; row buffer; Switching circuits; Voltage control
Citation
IEEE Transactions on Circuits and Systems II: Express Briefs, v.70, no.10, pp 3907 - 3911
Pages
5
Indexed
SCIE
SCOPUS
Journal Title
IEEE Transactions on Circuits and Systems II: Express Briefs
Volume
70
Number
10
Start Page
3907
End Page
3911
URI
https://scholarworks.dongguk.edu/handle/sw.dongguk/22736
DOI
10.1109/TCSII.2023.3295391
ISSN
1549-7747
1558-3791
Abstract
This paper presents a CMOS image sensor (CIS) integrated with a binarized neural network (BNN) for face detection in always-on image classification applications. We propose a process variation-immune comparator-based row buffer generating edge images that are inputs of the BNN processor. To reduce the power consumption of column-parallel row buffers, we adopted comparator-based switched capacitor (CBSC) circuits. With a proposed auto-zeroed current source block circuit that operates with low supply voltages, we observed a low variation of row buffers’ outputs. The measurement results showed that the σ/μ of the row buffers’ output is decreased by 4% while reducing 28% of power consumption compared to conventional CBSC-based row buffers. The proposed CIS with an in-column BNN processor having a single channel and two hidden layers was fabricated in a 1-poly 4-metal 110nm CIS process. As a measurement result, we achieved an image classification accuracy is 97.75%. Furthermore, the image resolution is 120×120, and the total power consumption of the proposed CIS is 3.78 mW with supply voltages of 2.8 V and 1.5 V at 240 frames per second. IEEE
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College of Engineering > Department of Industrial and Systems Engineering > 1. Journal Articles
College of Advanced Convergence Engineering > Division of System Semiconductor > 1. Journal Articles

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