Detailed Information

Cited 0 time in webofscience Cited 1 time in scopus
Metadata Downloads

Feature Extraction With Genetic Programming for Root Cause Identification in Manufacturing With Interpretable Machine Learningopen access

Authors
Lee, Chan GyuJun, Sungbum
Issue Date
Aug-2025
Publisher
IEEE
Keywords
Closed box; Data models; decision tree; Decision trees; dimensional awareness; Fault diagnosis; feature extraction; Feature extraction; genetic programming; interpretability; machine learning; Manufacturing; Predictive models
Citation
IEEE Transactions on Evolutionary Computation, v.29, no.4, pp 1029 - 1040
Pages
12
Indexed
SCIE
SCOPUS
Journal Title
IEEE Transactions on Evolutionary Computation
Volume
29
Number
4
Start Page
1029
End Page
1040
URI
https://scholarworks.dongguk.edu/handle/sw.dongguk/21818
DOI
10.1109/TEVC.2024.3388725
ISSN
1089-778X
1941-0026
Abstract
For fault detection (FD) in manufacturing, various machine learning (ML) models have been widely applied to minimise human intervention and improve detection performance. Even though ML models such as neural networks (NN) have been shown to identify faults effectively, root cause identification (RCI) is becoming more difficult due to their black-box structures and the trade-off between accuracy and interpretability. In order to improve performance while maintaining interpretability, we propose a new framework named FERMAT (Feature Extraction for finding Root causes for Manufacturing Applications with Tree-based algorithms), which enhances the performance of height-limited decision trees (C4.5) through dimensionally-aware genetic programming for feature extraction. Especially in FERMAT, only interpretable features are extracted to prevent decision trees from delivering uninterpretable expressions to practitioners. In the present study, FERMAT’s applicability to RCI was verified with both manufacturing and non-manufacturing datasets with different imbalance ratios. The experimental results showed that FERMAT outperformed the other single-tree-based models by extracting good features and delivered performance comparable to the black-box models. IEEE
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > Department of Industrial and Systems Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Jun, Sung Bum photo

Jun, Sung Bum
College of Engineering (Department of Industrial and Systems Engineering)
Read more

Altmetrics

Total Views & Downloads

BROWSE