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Preliminary investigation on the implementation of an artificial synapse using TaOx-based memristor with thermally oxidized active layer

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dc.contributor.authorKim, Juri-
dc.contributor.authorPark, Yongjin-
dc.contributor.authorLee, Jung-Kyu-
dc.contributor.authorKim, Sungjun-
dc.date.accessioned2024-08-08T09:01:00Z-
dc.date.available2024-08-08T09:01:00Z-
dc.date.issued2023-12-
dc.identifier.issn0021-9606-
dc.identifier.issn1089-7690-
dc.identifier.urihttps://scholarworks.dongguk.edu/handle/sw.dongguk/20862-
dc.description.abstractThis study presents a preliminary exploration of thermally oxidized TaOx-based memristors and their potential as artificial synapses. Unlike the 10-min annealed devices, which display instability due to current overshoots, the 5-min annealed device exhibits stable resistive switching, retention, and endurance characteristics. Moreover, our memristor showcases synaptic behaviors encompassing potentiation, depression, spike-timing-dependent plasticity, and excitatory postsynaptic currents. This synaptic emulation holds tremendous promise for applications in neuromorphic computing, offering the opportunity to replicate the adaptive learning principles observed in biological synapses. In addition, we evaluate the device's suitability for pattern recognition within a neural network using the modified National Institute of Standards and Technology dataset. Our assessment reveals that the Pt/TaOx/Ta memristor with an oxidized insulator achieves outstanding potential manifested by an accuracy of 93.25% for the identical pulse scheme and an impressive accuracy of 95.42% for the incremental pulse scheme.-
dc.format.extent8-
dc.language영어-
dc.language.isoENG-
dc.publisherAIP Publishing-
dc.titlePreliminary investigation on the implementation of an artificial synapse using TaOx-based memristor with thermally oxidized active layer-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1063/5.0182699-
dc.identifier.scopusid2-s2.0-85178850470-
dc.identifier.wosid001114915600002-
dc.identifier.bibliographicCitationThe Journal of Chemical Physics, v.159, no.21, pp 1 - 8-
dc.citation.titleThe Journal of Chemical Physics-
dc.citation.volume159-
dc.citation.number21-
dc.citation.startPage1-
dc.citation.endPage8-
dc.type.docTypeArticle-
dc.description.isOpenAccessY-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryChemistry, Physical-
dc.relation.journalWebOfScienceCategoryPhysics, Atomic, Molecular & Chemical-
dc.subject.keywordPlusRESISTIVE SWITCHING PARAMETERS-
dc.subject.keywordPlusNEURAL-NETWORK-
dc.subject.keywordPlusRRAM-
dc.subject.keywordPlusMEMORY-
dc.subject.keywordPlusDEVICES-
dc.subject.keywordPlusPLASTICITY-
dc.subject.keywordPlusOVERSHOOT-
dc.subject.keywordPlusMECHANISM-
dc.subject.keywordPlusTERM-
dc.subject.keywordAuthorDisplay Devices-
dc.subject.keywordAuthorNeurons-
dc.subject.keywordAuthorOxidation-
dc.subject.keywordAuthorPattern Recognition-
dc.subject.keywordAuthor'current-
dc.subject.keywordAuthorActive Layer-
dc.subject.keywordAuthorArtificial Synapse-
dc.subject.keywordAuthorCurrent Overshoot-
dc.subject.keywordAuthorMemristor-
dc.subject.keywordAuthorNeuromorphic Computing-
dc.subject.keywordAuthorResistive Switching-
dc.subject.keywordAuthorSpike Timing Dependent Plasticities-
dc.subject.keywordAuthorSwitching Retention-
dc.subject.keywordAuthorThermally Oxidized-
dc.subject.keywordAuthorMemristors-
dc.subject.keywordAuthorArticle-
dc.subject.keywordAuthorDepression-
dc.subject.keywordAuthorElectric Potential-
dc.subject.keywordAuthorEndurance-
dc.subject.keywordAuthorExcitatory Postsynaptic Potential-
dc.subject.keywordAuthorMemristor-
dc.subject.keywordAuthorNerve Cell Network-
dc.subject.keywordAuthorPattern Recognition-
dc.subject.keywordAuthorSynapse-
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