Artificial Synapse Emulated by Indium Tin Oxide/SiN/TaN Resistive Switching Device for Neuromorphic Systemopen access
- Authors
- Ju, Dongyeol; Kim, Sunghun; Kim, Sungjun
- Issue Date
- Sep-2023
- Publisher
- MDPI
- Keywords
- resistive switching; neuromorphic system; synaptic plasticity; Hebbian learning rules; short-term memory
- Citation
- Nanomaterials, v.13, no.17, pp 1 - 13
- Pages
- 13
- Indexed
- SCIE
SCOPUS
- Journal Title
- Nanomaterials
- Volume
- 13
- Number
- 17
- Start Page
- 1
- End Page
- 13
- URI
- https://scholarworks.dongguk.edu/handle/sw.dongguk/18652
- DOI
- 10.3390/nano13172477
- ISSN
- 2079-4991
2079-4991
- Abstract
- In this paper, we fabricate an ITO/SiN/TaN memristor device and analyze its electrical characteristics for a neuromorphic system. The device structure and chemical properties are investigated using transmission electron microscopy and X-ray photoelectron spectroscopy. Uniform bipolar switching is achieved through DC sweep under a compliance current of 5 mA. Also, the analog reset phenomenon is observed by modulating the reset voltage for long-term memory. Additionally, short-term memory characteristics are obtained by controlling the strength of the pulse response. Finally, bio-inspired synaptic characteristics are emulated using Hebbian learning rules such as spike-rate-dependent plasticity (SRDP) and spike-timing-dependent plasticity (STDP). As a result, we believe that the coexistence of short-term and long-term memories in the ITO/SiN/TaN device can provide flexibility in device design in future neuromorphic applications.
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- Appears in
Collections - College of Engineering > Department of Electronics and Electrical Engineering > 1. Journal Articles

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