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Analysis of defect states of oxide semiconductor films with multi-cations using photo-induced current transient spectroscopy
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 정권범 | - |
| dc.date.accessioned | 2023-05-11T16:41:48Z | - |
| dc.date.available | 2023-05-11T16:41:48Z | - |
| dc.date.issued | 2019-05-27 | - |
| dc.identifier.uri | https://scholarworks.dongguk.edu/handle/sw.dongguk/13610 | - |
| dc.title | Analysis of defect states of oxide semiconductor films with multi-cations using photo-induced current transient spectroscopy | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | European Materials Research Society (EMRS) | - |
| dc.citation.conferencePlace | 프랑스 | - |
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Related Researcher
- Chung, Kwun Bum
- College of Natural Science (Department of Physics)