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SCIESCOPUS
Control of sensitivity in metal oxide electrolyte gated field-effect transistor-based glucose sensor by electronegativity modulationopen access

Song, Aeran; Kim, Min Jung; Yi, Dong-Joon; Kwon, Soyeong; Kim, Dong-Wook; Kim, Seunghwan; Bae, Jee-Hwan; Park, Soohyung; Rim, You Seung; Jeong, Kwang-Sik, et al.

ArticleIssue Date2024CitationScientific Reports, v.14, no.1PublisherNature Portfolio
SCIESCOPUS
Double Gated a-InGaZnO TFT Properties Based on Quantitative Defect Analysis and Computational Modeling

Hong, Hyunmin; Yi, Dong-Joon; Moon, Yeon-Keon; Son, Kyoung-Seok; Lim, Jun Hyung; Jeong, KwangSik; Chung, Kwun-Bum

ArticleIssue Date2024CitationIEEE Transactions on Electron Devices, v.71, no.2, pp 1097 - 1101PublisherIEEE
SCIESCOPUS
Evaluation of the high mobility and stability of InGaZnO/InSnZnO bilayer thin-film transistors via quantitative defect analysisopen access

Weldemhret, Teklebrahan Gebrekrstos; Yi, Dong-Joon; Jeong, Kwangsik; Chung, Kwun-Bum

ArticleIssue Date2025CitationSurfaces and Interfaces, v.71, pp 1 - 9PublisherELSEVIER
SCIESCOPUS
Noncontact Monitoring and Imaging of the Operation and Performance of Thin-Film Field-Effect Transistors

Jeong, Kwangsik; Shin, Dong yeob; Park, Ji-Min; Yi, Dong-Joon; Hong, Hyunmin; Kim, Hyun-Suk; Chung, Kwun-Bum

ArticleIssue Date2025CitationAdvanced Science, v.12, no.5, pp 1 - 8PublisherWILEY
SCIESCOPUS
Quantitative analysis of defect states in InGaZnO within 2 eV below the conduction band via photo-induced current transient spectroscopyopen access

Hong, Hyunmin; Kim, Min Jung; Yi, Dong-Joon; Moon, Yeon-Keon; Son, Kyoung-Seok; Lim, Jun Hyung; Jeong, KwangSik; Chung, Kwun-Bum

ArticleIssue Date2023CitationScientific Reports, v.13, no.1PublisherNature Portfolio
SCIESCOPUS
Quantitative Dynamic Evolution of Unoccupied States in Hydrogen Diffused InGaZnSnO TFT under Positive Bias Temperature Stress

Hong, Hyunmin; Kim, Min Jung; Yi, Dong-Joon; Shin, Dong Yeob; Moon, Yeon-Keon; Son, Kyoung-Seok; Lim, Jun Hyung; Jeong, Kwang Sik; Chung, Kwun-Bum

ArticleIssue Date2024CitationACS Applied Electronic Materials, v.6, no.10, pp 7584 - 7590PublisherAmerican Chemical Society
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