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Effect of Bias Potential on the Interface of a Solid Electrolyte and Electrode during XPS Depth Profiling Analysis

Seo, Minsik; Lee, Yonghee; Shin, Hyunsuk; Kim, Eunji; Kim, Hyun-Suk; Chung, Kwun-Bum; Kim, Gyungtae; Mun, Bongjin Simon

ArticleIssue Date2024CitationACS Applied Materials & Interfaces, v.16, no.20, pp 26922 - 26931PublisherAmerican Chemical Society
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