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Evolution of Defect States within the Band Gap of Indium-Tin-Zinc Oxide Thin Film Transistors Using the Quantitative Defect Analysis Method

Shin, Dong Yeob; Kim, Min Jung; Go, Jinyoung; Hong, Hyunmin; Lee, Sunwoo; Park, Younggil; Weldemhret, Teklebrahan Gebrekrstos; Jeong, Kwangsik; Chung, Kwun-Bum

ArticleIssue Date2025CitationACS Applied Electronic Materials, v.7, no.7, pp 2928 - 2938PublisherAmerican Chemical Society
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