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Worst Case Sampling Method with Confidence Ellipse for Estimating the Impact of Random Variation on Static Random Access Memory (SRAM)

Oh, Sangheon; Jo, Jaesung; Lee, Hyunjae; Lee, Gyo Sub; Park, Jung-Dong; Shin, Changhwan

ArticleIssue Date2015CitationJOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, v.15, no.3, pp 374 - 380PublisherIEEK PUBLICATION CENTER
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