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Effects of spontaneous nitrogen incorporation by a 4H-SiC(0001) surface caused by plasma nitridation

Kim, Dae-Kyoung; Kang, Yu-Seon; Jeong, Kwang-Sik; Kang, Hang-Kyu; Cho, Sang Wan; Chung, Kwun-Bum; Kim, Hyoungsub; Cho, Mann-Ho

ArticleIssue Date2015CitationJOURNAL OF MATERIALS CHEMISTRY C, v.3, no.19, pp 5078 - 5088PublisherROYAL SOC CHEMISTRY
SCISCIESCOPUS
Interface engineering for a stable chemical structure of oxidized-black phosphorus via self-reduction in AlOx atomic layer deposition

Kim, Dae-Kyoung; Chae, Jimin; Hong, Seok-Bo; Park, Hanbum; Jeong, Kwang-Sik; Park, Hyun-Woo; Kwon, Se-Ra; Chung, Kwun-Bum; Cho, Mann-Ho

ArticleIssue Date2018CitationNANOSCALE, v.10, no.48, pp 22896 - 22907PublisherROYAL SOC CHEMISTRY
SCISCIESCOPUS
Reduction of defect states in atomic-layered HfO2 film on SiC substrate using post-nitridation annealing

Kwon, Sera; Kim, Dae-Kyoung; Cho, Mann-Ho; Chung, Kwun-Bum

ArticleIssue Date2018CitationTHIN SOLID FILMS, v.645, pp 102 - 107PublisherELSEVIER SCIENCE SA
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